{"title":"The QUEST System in Intel Fab18: a web-based method for the management of quality","authors":"Y. Kaplan","doi":"10.1109/ISSM.2001.963008","DOIUrl":null,"url":null,"abstract":"The QUEST System provides a web-based platform for the standardized management, tracking and assessment of quality excursion events across an entire Fab. The system has become the pivot of Intel Corporation Fab18's quality excursion event management and is now in the process of implementation in other factories.","PeriodicalId":356225,"journal":{"name":"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM.2001.963008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The QUEST System provides a web-based platform for the standardized management, tracking and assessment of quality excursion events across an entire Fab. The system has become the pivot of Intel Corporation Fab18's quality excursion event management and is now in the process of implementation in other factories.
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