D. MacSweeney, K. McCarthy, A. Mathewson, J. A. Power, S. C. Kelly
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引用次数: 4
Abstract
In this paper, the effect of the substrate interaction is examined for the R/sub E/ flyback method which is commonly used to measure the emitter resistance of BJT devices. By considering the structure to be a combination of two devices, the measurement conditions can be understood better for different substrate configurations, giving improved confidence in the method.
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