{"title":"Design-for-Test method for high-speed ADCs: Behavioral description and optimization","authors":"Y. Lechuga, R. Mozuelos, Mar Martínez, S. Bracho","doi":"10.1109/DDECS.2011.5783043","DOIUrl":null,"url":null,"abstract":"This paper presents a Design-for-Test (DfT) approach for folded analog to digital converters. A sensor circuit is designed to sample several internal ADC test points at the same time, so that, by computing the relative deviation among them the presence of a defect can be detected. A fault evaluation is carried out on a behavioral model to compare the coverage of the proposed test approach with the one obtained from a functional test. Then, the analysis is moved to a transistor level implementation of the ADC to establish the threshold limits for the DfT circuit that maximize the fault coverage figure of the test approach.","PeriodicalId":231389,"journal":{"name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2011.5783043","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents a Design-for-Test (DfT) approach for folded analog to digital converters. A sensor circuit is designed to sample several internal ADC test points at the same time, so that, by computing the relative deviation among them the presence of a defect can be detected. A fault evaluation is carried out on a behavioral model to compare the coverage of the proposed test approach with the one obtained from a functional test. Then, the analysis is moved to a transistor level implementation of the ADC to establish the threshold limits for the DfT circuit that maximize the fault coverage figure of the test approach.
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