Noise Contribution to Switching Current Distributions in NbN Nanowires

Ashley Qu, Di Zhu, K. Berggren
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Abstract

The working mechanism behind superconducting nanowire-based devices is the electrothermal transition from the superconducting to normal state, at which the point is known as the switching current. Due to the stochastic nature of nanowires from thermal fluctuations, quantum fluctuations, electrical noise, and black-body radiation, superconducting nanowire-based devices suffer from low repeatability in measurements. Here, we use a tapered and non-tapered NbN nanowire to identify and quantify the effects of ramp rate on the switching current distribution at 1 K. We also plan to expand the model presented by McCaughan et al that includes the noise of the measurement system.
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噪声对NbN纳米线开关电流分布的影响
基于超导纳米线的器件背后的工作机制是从超导到正常状态的电热转变,在这个点被称为开关电流。由于纳米线在热波动、量子波动、电噪声和黑体辐射等方面的随机性,超导纳米线器件在测量中重复性较低。在这里,我们使用锥形和非锥形的NbN纳米线来识别和量化斜坡速率对1k时开关电流分布的影响。我们还计划扩展McCaughan等人提出的模型,其中包括测量系统的噪声。
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