{"title":"Series Arrays of Long Josephson Junctions Fabricated with a Focused Helium Ion Beam in YBa2Cu3O7-δ","authors":"J. LeFebvre, E. Cho, Kevin Pratt, S. Cybart","doi":"10.1109/ISEC46533.2019.8990938","DOIUrl":null,"url":null,"abstract":"We investigated series arrays of closely spaced, planar long Josephson junctions for magnetic flux transduction with a linear response and high dynamic range. The devices were fabricated from 30-nm thick high-temperature superconducting YBa2Cu3O7-δ(YBCO) thin films, using focused helium ion beam irradiation to create the Josephson barriers. Series arrays consisting of 600 long junctions, were fabricated and electrically tested. From fits of the current-voltage characteristics we estimate the standard deviation in critical current to be around 25%. Voltage-magnetic field measurements exhibit a sharp transfer function with a modulation depth of 11 mV over a range of 135μ $T$ at 71 K.","PeriodicalId":250606,"journal":{"name":"2019 IEEE International Superconductive Electronics Conference (ISEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Superconductive Electronics Conference (ISEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEC46533.2019.8990938","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We investigated series arrays of closely spaced, planar long Josephson junctions for magnetic flux transduction with a linear response and high dynamic range. The devices were fabricated from 30-nm thick high-temperature superconducting YBa2Cu3O7-δ(YBCO) thin films, using focused helium ion beam irradiation to create the Josephson barriers. Series arrays consisting of 600 long junctions, were fabricated and electrically tested. From fits of the current-voltage characteristics we estimate the standard deviation in critical current to be around 25%. Voltage-magnetic field measurements exhibit a sharp transfer function with a modulation depth of 11 mV over a range of 135μ $T$ at 71 K.
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