Andrej Magdolen, Jana Bezakova, E. Gramatová, M. Fischerová
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引用次数: 4
Abstract
The authors describe the functional test generator REGGEN on a register transfer level. The technique of the symbolic simulation was modified by new rules to simplify symbolic expressions. In the REGGEN system a fault simulator at the RT level is also implemented. The efficiency of the REGGEN system has been proved on several gate arrays.<>
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