System test cost modelling based on event rate analysis

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing Pub Date : 1994-10-02 DOI:10.1109/TEST.1994.527939

D. Farren, A. Ambler

引用次数: 13

Abstract

Unlike IC and board level test, system complexity generally limits the number of methods available to support cost-optimised system test strategy development. This paper describes a parameterised model of system behaviour during both production testing and initial field run-time. The model represents the occurrence rate of error and failure events under test and application workloads and the resulting parameters directly characterise system test effectiveness. These event rate models are fitted to actual data and incorporated into a cost function which calculates overall "cost of test" in relation to key variables. The approach is applicable to both hardware and software related events and promotes a customer view of system quality.

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基于事件率分析的系统测试成本建模

与集成电路和板级测试不同，系统复杂性通常限制了可用于支持成本优化系统测试策略开发的方法的数量。本文描述了在生产测试和初始现场运行期间系统行为的参数化模型。该模型表示测试和应用程序工作负载下错误和失败事件的发生率，结果参数直接表征系统测试有效性。这些事件率模型适用于实际数据，并纳入成本函数，计算与关键变量相关的总体“测试成本”。该方法适用于硬件和软件相关事件，并促进客户对系统质量的看法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing

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