{"title":"Effects of voids on bump chip carrier (BCC++) solder joint reliability","authors":"J. Lau, S. Erasmus, S. Pan","doi":"10.1109/ECTC.2002.1008222","DOIUrl":null,"url":null,"abstract":"In this study, the effects of voids on the solder joint reliability of bump chip carrier (BCC++) packages on a printed circuit board are investigated. Emphasis is placed on the void size, void location, and void percentage. The solder is assumed to obey the Garofalo-Arrhenius creep constitutive equation. A total of 12 different cases are studied. In addition, the effects of voids on the crack growth in the BCC++ solder joint are studied by the fracture mechanics method. Emphasis is placed on the demonstration that a crack in the solder joint may be stopped by a void in front of it.","PeriodicalId":285713,"journal":{"name":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2002.1008222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
In this study, the effects of voids on the solder joint reliability of bump chip carrier (BCC++) packages on a printed circuit board are investigated. Emphasis is placed on the void size, void location, and void percentage. The solder is assumed to obey the Garofalo-Arrhenius creep constitutive equation. A total of 12 different cases are studied. In addition, the effects of voids on the crack growth in the BCC++ solder joint are studied by the fracture mechanics method. Emphasis is placed on the demonstration that a crack in the solder joint may be stopped by a void in front of it.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
