{"title":"Analysis of reliability growth model of domestic large thermal power unit","authors":"W. Zhao, Pengzhang Liu, Guangchun Zhou","doi":"10.1109/ICRMS.2016.8050137","DOIUrl":null,"url":null,"abstract":"In this paper propose a method for determining the reliability parameters of repairable large thermal power units. The Weibull distribution model is applied to estimate the reliability parameters of Chinese-built 300 and 600-MW thermal power units. An analysis of both the FEMA fault and reliability growth models for the two thermal power units, is conducted to reveal the relationship between the increase in reliability and design improvements made after the elimination of defects. In addition, we compare the Chinese and American reliability growth models.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICRMS.2016.8050137","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper propose a method for determining the reliability parameters of repairable large thermal power units. The Weibull distribution model is applied to estimate the reliability parameters of Chinese-built 300 and 600-MW thermal power units. An analysis of both the FEMA fault and reliability growth models for the two thermal power units, is conducted to reveal the relationship between the increase in reliability and design improvements made after the elimination of defects. In addition, we compare the Chinese and American reliability growth models.
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