N. Robson, J. Safran, C. Kothandaraman, A. Cestero, Xiang Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer
{"title":"Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips","authors":"N. Robson, J. Safran, C. Kothandaraman, A. Cestero, Xiang Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer","doi":"10.1109/CICC.2007.4405850","DOIUrl":null,"url":null,"abstract":"Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.","PeriodicalId":130106,"journal":{"name":"2007 IEEE Custom Integrated Circuits Conference","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"71","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2007.4405850","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 71
Abstract
Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.
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