A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard

Jennifer Dworak, A. Crouch
{"title":"A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard","authors":"Jennifer Dworak, A. Crouch","doi":"10.1109/VTS.2015.7116256","DOIUrl":null,"url":null,"abstract":"Today's chips often contain a wealth of embedded instruments, including sensors, hardware monitors, built-in self-test (BIST) engines, etc. They may process sensitive data that requires encryption or obfuscation and may contain encryption keys and ChipIDs. Unfortunately, unauthorized access to internal registers or instruments through test and debug circuitry can turn design for testability (DFT) logic into a backdoor for data theft, reverse engineering, counterfeiting, and denial-of-service attacks. A compromised chip also poses a security threat to any board or system that includes that chip, and boards have their own security issues. We will provide an overview of some chip and board security concerns as they relate to DFT hardware and will briefly review several ways in which the new IEEE 1687 standard can be made more secure. We will then discuss the need for an IEEE Security Standard that can provide solutions and metrics for providing appropriate security matched to the needs of a real world environment.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 33rd VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2015.7116256","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31

Abstract

Today's chips often contain a wealth of embedded instruments, including sensors, hardware monitors, built-in self-test (BIST) engines, etc. They may process sensitive data that requires encryption or obfuscation and may contain encryption keys and ChipIDs. Unfortunately, unauthorized access to internal registers or instruments through test and debug circuitry can turn design for testability (DFT) logic into a backdoor for data theft, reverse engineering, counterfeiting, and denial-of-service attacks. A compromised chip also poses a security threat to any board or system that includes that chip, and boards have their own security issues. We will provide an overview of some chip and board security concerns as they relate to DFT hardware and will briefly review several ways in which the new IEEE 1687 standard can be made more secure. We will then discuss the need for an IEEE Security Standard that can provide solutions and metrics for providing appropriate security matched to the needs of a real world environment.
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行动呼吁:保护IEEE 1687和需要一个IEEE测试安全标准
今天的芯片通常包含丰富的嵌入式仪器,包括传感器,硬件监视器,内置自检(BIST)引擎等。它们可能处理需要加密或混淆的敏感数据,并可能包含加密密钥和chipid。不幸的是,通过测试和调试电路对内部寄存器或仪器的未经授权访问可能会将可测试性设计(DFT)逻辑变成数据盗窃、逆向工程、伪造和拒绝服务攻击的后门。受损的芯片也会对包含该芯片的任何板或系统构成安全威胁,而板有自己的安全问题。我们将概述一些与DFT硬件相关的芯片和电路板安全问题,并简要回顾几种使新的IEEE 1687标准更安全的方法。然后,我们将讨论对IEEE安全标准的需求,该标准可以提供解决方案和度量,以提供与现实世界环境需求相匹配的适当安全性。
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