{"title":"A new BIST scheme for 5GHz low noise amplifiers","authors":"J. Ryu, Bruce C. Kim, I. Sylla","doi":"10.1109/ETSYM.2004.1347625","DOIUrl":null,"url":null,"abstract":"This paper presents a new low-cost Built-In Self-Test (BIST) circuit for measuring gain, noise figure and input impedance of 5GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.","PeriodicalId":358790,"journal":{"name":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","volume":"271 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETSYM.2004.1347625","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
This paper presents a new low-cost Built-In Self-Test (BIST) circuit for measuring gain, noise figure and input impedance of 5GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.
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