Research on fast and intelligent calibration method based on automatic test system

Zaiming Fu, Nan Ren, Liu Ke, Yijiu Zhao
{"title":"Research on fast and intelligent calibration method based on automatic test system","authors":"Zaiming Fu, Nan Ren, Liu Ke, Yijiu Zhao","doi":"10.1109/AUTEST.2018.8532519","DOIUrl":null,"url":null,"abstract":"The paper studies a new calibration method based on the framework of automatic test system. The method uses IVI (Interchangeable Virtual Instruments) as the hardware basis of the system to discuss the fast and intelligent automatic calibration of the test equipment. It intelligently analyzes the correlation of system parameters for highly complex calibrated instruments using a stepwise regression, and accurately selects high correlation factors for the calibration of each parameter. And it performs accurate multistage segmentation of the calibrated parameters using the M5 model tree algorithm to ensure calculating the linear regression equation under the least mean square and realizing the fitting and calibration of each parameter; and calibration results are then configured as a file to the folder set by the calibrated instrument to replace the original calibration file. It does not require highly experienced engineers to perform a large number of analyses, but automatically tests, autonomously analyzes, automatically calculates, generates and gives calibration files. The system is fast, intelligent, and efficient. In the paper, the self-made pulse generator is taken as an example, and the amplitude of the pulse generator is calibrated. The calibrated system error is less than 1.5%.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"156 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The paper studies a new calibration method based on the framework of automatic test system. The method uses IVI (Interchangeable Virtual Instruments) as the hardware basis of the system to discuss the fast and intelligent automatic calibration of the test equipment. It intelligently analyzes the correlation of system parameters for highly complex calibrated instruments using a stepwise regression, and accurately selects high correlation factors for the calibration of each parameter. And it performs accurate multistage segmentation of the calibrated parameters using the M5 model tree algorithm to ensure calculating the linear regression equation under the least mean square and realizing the fitting and calibration of each parameter; and calibration results are then configured as a file to the folder set by the calibrated instrument to replace the original calibration file. It does not require highly experienced engineers to perform a large number of analyses, but automatically tests, autonomously analyzes, automatically calculates, generates and gives calibration files. The system is fast, intelligent, and efficient. In the paper, the self-made pulse generator is taken as an example, and the amplitude of the pulse generator is calibrated. The calibrated system error is less than 1.5%.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于自动测试系统的快速智能校准方法研究
本文研究了一种基于自动测试系统框架的新型标定方法。该方法以可互换虚拟仪器(IVI)作为系统的硬件基础,探讨了测试设备的快速智能自动校准。它采用逐步回归的方法对高度复杂的校准仪器系统参数的相关性进行智能分析,并准确地选择高相关因子对各参数进行校准。利用M5模型树算法对标定参数进行精确的多阶段分割,确保在最小均方差下计算线性回归方程,实现各参数的拟合和标定;然后将校准结果以文件的形式配置到被校准仪器设置的文件夹中,以取代原有的校准文件。它不需要经验丰富的工程师来执行大量的分析,而是自动测试,自主分析,自动计算,生成并给出校准文件。该系统快速、智能、高效。本文以自制脉冲发生器为例,对脉冲发生器的幅值进行了标定。标定后的系统误差小于1.5%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Spread Spectrum Time Domain Reflectometry for Complex Impedances: Application to PV Arrays Challenges and Solutions for Testing Modern Optically Networked Weapon Systems Test Challenges of Multi-Gigabit Serial Buses Automated Testing Importance and Impact Research on fast and intelligent calibration method based on automatic test system
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1