An 8-bit 0.7-GS/s single channel flash-SAR ADC in 65-nm CMOS technology

Abstract

This paper presents the prototype of a single channel 8-bit 0.7-GS/s A/D converter implemented in a 65-nm CMOS process. The required thresholds are generated from the resistive interpolation embedded within the preamplifier preceding the latches. The active area of the chip is 150 × 220 μm2 and the total power consumption is 5.96 mW. At Nyquist, the ADC achieves 6.62 ENOB, resulting in a figure of merit equal to 86.7 fJ/conversion-step.