CAE Durability Simulation of Vibration Sweep Tests

J. M. Hu, G. Garfinkel
{"title":"CAE Durability Simulation of Vibration Sweep Tests","authors":"J. M. Hu, G. Garfinkel","doi":"10.1115/imece1996-0889","DOIUrl":null,"url":null,"abstract":"\n This paper presents a simulation method for vibration sweep tests of components and interconnects. The paper introduces the computational method to determine cumulative fatigue damage as a function of the stress-frequency response, the sweep rate and the testing time, demonstrates the “local stress-strain” approach to predict the non-linear (elastic-plastic) stress at the potential failure sites through the linear dynamic finite element analysis in the frequency domain. As an application example, the analysis procedure and computational results for the aluminum wire-bonding between a silicon chip and printed wiring board are presented.","PeriodicalId":375055,"journal":{"name":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/imece1996-0889","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper presents a simulation method for vibration sweep tests of components and interconnects. The paper introduces the computational method to determine cumulative fatigue damage as a function of the stress-frequency response, the sweep rate and the testing time, demonstrates the “local stress-strain” approach to predict the non-linear (elastic-plastic) stress at the potential failure sites through the linear dynamic finite element analysis in the frequency domain. As an application example, the analysis procedure and computational results for the aluminum wire-bonding between a silicon chip and printed wiring board are presented.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
振动扫描试验的CAE耐久性模拟
本文提出了一种用于部件和连接件振动扫描试验的仿真方法。介绍了以应力-频率响应、扫描速率和试验时间为函数确定累积疲劳损伤的计算方法,论证了通过频域线性动力有限元分析,用“局部应力-应变”法预测潜在破坏部位的非线性(弹塑性)应力。作为应用实例,给出了硅芯片与印刷线路板之间铝线键合的分析过程和计算结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Thermomechanical Stress Analyses of Plated-Through Holes in PWB Using Internal State Variable Constitutive Models Step Soldering Factors Affecting the Reliability of Ag-Pd Thick Film Conductor Pads CAE Durability Simulation of Vibration Sweep Tests Flow Modeling of Wire Sweep in Transfer Molding Finite Element Vibration Analysis for Zero Inserting Force Socket
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1