A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs

B. Du, M. Colucci, S. Francola, L. Aranci, E. Artina, N. Ratti, E. Picardi, R. Mancini, V. Piloni, S. Azimi, L. Sterpone
{"title":"A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs","authors":"B. Du, M. Colucci, S. Francola, L. Aranci, E. Artina, N. Ratti, E. Picardi, R. Mancini, V. Piloni, S. Azimi, L. Sterpone","doi":"10.1109/RADECS50773.2020.9857686","DOIUrl":null,"url":null,"abstract":"We present a SET generation and propagation model based on Hann-smoothing function for 65nm Flash-based FPGAs. The model has been characterized with heavy-ions radiation campaigns demonstrating its viable usage for circuit analysis and mitigation purposes.","PeriodicalId":371838,"journal":{"name":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS50773.2020.9857686","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We present a SET generation and propagation model based on Hann-smoothing function for 65nm Flash-based FPGAs. The model has been characterized with heavy-ions radiation campaigns demonstrating its viable usage for circuit analysis and mitigation purposes.
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基于65nm闪存的fpga上重离子诱导单事件瞬态的新传播模型
提出了一种基于han -smoothing函数的65nm flash fpga的SET生成和传播模型。该模型具有重离子辐射运动的特征,证明了其用于电路分析和缓解目的的可行性。
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