{"title":"Test pattern embedding in sequential circuits through cellular automata","authors":"F. Fummi, D. Sciuto, M. Serra","doi":"10.1109/ASPDAC.1995.486390","DOIUrl":null,"url":null,"abstract":"The embedding of test patterns into a sequential circuit is the main topic of this paper. Deterministic test patterns for the sequential circuit under test are chosen to be embedded into hybrid cellular automata (CA). Test identification and CA synthesis are performed in parallel thus overcoming results achieved by embedding pre-computed vectors. The theory of sequential test generation under such a constraint is provided and the feasibility of the proposed testing methodology is shown on benchmarks.","PeriodicalId":119232,"journal":{"name":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1995.486390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The embedding of test patterns into a sequential circuit is the main topic of this paper. Deterministic test patterns for the sequential circuit under test are chosen to be embedded into hybrid cellular automata (CA). Test identification and CA synthesis are performed in parallel thus overcoming results achieved by embedding pre-computed vectors. The theory of sequential test generation under such a constraint is provided and the feasibility of the proposed testing methodology is shown on benchmarks.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
