Kohki Taniguchi, N. Miura, Taisuke Hayashi, M. Nagata
{"title":"At-Product-Test Dedicated Adaptive supply-resonance suppression","authors":"Kohki Taniguchi, N. Miura, Taisuke Hayashi, M. Nagata","doi":"10.1109/VTS.2015.7116273","DOIUrl":null,"url":null,"abstract":"This paper presents an adaptive supply-resonance (SR) suppression scheme at a product testing stage. Dedicated to each product in different assembly forms, an on-chip power-delivery-network analyzer identifies SR frequency and autotunes notch filter for SR noise suppression. The feasibility has been silicon-proven by a prototype demonstration in 0.18μm CMOS successfully.","PeriodicalId":187545,"journal":{"name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","volume":"93 Pt A 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 33rd VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2015.7116273","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents an adaptive supply-resonance (SR) suppression scheme at a product testing stage. Dedicated to each product in different assembly forms, an on-chip power-delivery-network analyzer identifies SR frequency and autotunes notch filter for SR noise suppression. The feasibility has been silicon-proven by a prototype demonstration in 0.18μm CMOS successfully.
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