Evaluating Security of New Locking SIB-based Architectures

Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Subidh Ali
{"title":"Evaluating Security of New Locking SIB-based Architectures","authors":"Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Subidh Ali","doi":"10.1109/ETS54262.2022.9810460","DOIUrl":null,"url":null,"abstract":"The IEEE Std 1687 (IJT AG) provides enhanced access to the on-chip test instruments, which are included on the chip for test, post-silicon debug, in field maintenance, and diagnosis purposes. Although the on-chip instruments access provides data and features explicitly for test and debug, these features are misused by the malicious user to access sensitive data such as encryption keys, Chip-IDs, etc. Hence, it is desired to limit the access to sensitive on-chip instruments via IJT AG network. One of the various schemes proposed to mitigate the vulnerability of the IJT AG network is to use a secure access protocol, which is based on LSIB, Chip-ID, and licensed access software.In this paper, the detailed security analysis is performed on IJT AG, it is shown that the secure access protocol technique is vulnerable to differential analysis attack. It can be used to break the secure communication between the board and the licensed access software and thus, the sensitive on-chip test instruments can be accessed illegitimately. It is shown that our proposed algorithm can recover the template used for secure communication within a fraction of a second.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS54262.2022.9810460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The IEEE Std 1687 (IJT AG) provides enhanced access to the on-chip test instruments, which are included on the chip for test, post-silicon debug, in field maintenance, and diagnosis purposes. Although the on-chip instruments access provides data and features explicitly for test and debug, these features are misused by the malicious user to access sensitive data such as encryption keys, Chip-IDs, etc. Hence, it is desired to limit the access to sensitive on-chip instruments via IJT AG network. One of the various schemes proposed to mitigate the vulnerability of the IJT AG network is to use a secure access protocol, which is based on LSIB, Chip-ID, and licensed access software.In this paper, the detailed security analysis is performed on IJT AG, it is shown that the secure access protocol technique is vulnerable to differential analysis attack. It can be used to break the secure communication between the board and the licensed access software and thus, the sensitive on-chip test instruments can be accessed illegitimately. It is shown that our proposed algorithm can recover the template used for secure communication within a fraction of a second.
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评估新的基于sib的锁定体系结构的安全性
IEEE标准1687 (IJT AG)提供了对片上测试仪器的增强访问,这些仪器包含在芯片上,用于测试,硅后调试,现场维护和诊断目的。尽管片上仪器访问明确地为测试和调试提供了数据和功能,但恶意用户会滥用这些功能来访问敏感数据,如加密密钥、芯片id等。因此,希望通过IJT AG网络限制对敏感片上仪器的访问。为了减轻IJT AG网络的脆弱性,提出的各种方案之一是使用基于LSIB、Chip-ID和许可访问软件的安全访问协议。本文对IJT AG进行了详细的安全分析,表明安全访问协议技术容易受到差分分析攻击。它可以破坏电路板与授权接入软件之间的安全通信,从而使敏感的片上测试仪器被非法访问。结果表明,该算法可以在几分之一秒内恢复用于安全通信的模板。
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