New result in 6H SiC "site-competition" epitaxy

V. Zelenin, A. Lebedev, M. Rastegaeva, D. Davydov, V. Chelnokov
{"title":"New result in 6H SiC \"site-competition\" epitaxy","authors":"V. Zelenin, A. Lebedev, M. Rastegaeva, D. Davydov, V. Chelnokov","doi":"10.1109/SMICND.1998.733762","DOIUrl":null,"url":null,"abstract":"The investigation of the 6H-SiC layers grown by CVD in methane-silane-hydrogen system shows that with increase of C/Si ratio in gas phase there is the inversion of type of conductivity. I-DLTS study of grown p-type conductivity layers shows that a main contribution to N/sub A/-N/sub D/ gives a deep acceptor centers, which are close to parameters of usual background centers in layers prepared by sublimation epitaxy method.","PeriodicalId":406922,"journal":{"name":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1998.733762","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The investigation of the 6H-SiC layers grown by CVD in methane-silane-hydrogen system shows that with increase of C/Si ratio in gas phase there is the inversion of type of conductivity. I-DLTS study of grown p-type conductivity layers shows that a main contribution to N/sub A/-N/sub D/ gives a deep acceptor centers, which are close to parameters of usual background centers in layers prepared by sublimation epitaxy method.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
6H SiC“位点竞争”外延的新成果
对甲烷-硅烷-氢体系CVD生长的6H-SiC层的研究表明,随着气相C/Si比的增加,其电导率类型发生反转。对生长的p型电导率层的i - dts研究表明,N/sub a /-N/sub D/的主要贡献是得到了一个较深的受体中心,这与升华外延法制备的p型电导率层的通常背景中心参数接近。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Low parasitic elements and self aligned contacts technology for high frequency bipolar integrated circuits a-SiC(O,N):H thin films-their optical properties and possible applications Metallic contacts on porous silicon layers A new propylamine sensor using artificial dimorphite An accurate method of 6H-SiC PIN structures parameter extraction using C-V characteristics
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1