{"title":"Total Dose Performance at High and Low Dose Rate of a CMOS, Low Dropout Voltage Regulator showing Enhanced Low Dose Rate Sensitivity","authors":"D. Hiemstra, S. Shi, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679352","DOIUrl":null,"url":null,"abstract":"Results of Cobalt-60 irradiation of a CMOS low dropout voltage regulator at high and low dose rate are, presented. Hardness assurance implications due to observation of ELDRS for analog CMOS microcircuits are, discussed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC45046.2021.9679352","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Results of Cobalt-60 irradiation of a CMOS low dropout voltage regulator at high and low dose rate are, presented. Hardness assurance implications due to observation of ELDRS for analog CMOS microcircuits are, discussed.
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