Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679329
M. Von Thun, P. Nelson, A. Turnbull, B. Baranski
Single Event Latch-up (SEL) and Total Ionizing Dose (TID) radiation characterization was performed on a CAES quantified-off-the-shelf (QCOTS) 512Gb 3D NAND flash memory. The device was shown to be suitable for space applications.
在CAES定量现货(QCOTS) 512Gb 3D NAND闪存上进行了单事件锁存(SEL)和总电离剂量(TID)辐射表征。该装置已证明适合于空间应用。
{"title":"SEL and TID Characterization of a CAES QCOTS 512Gb NAND Flash Nonvolatile Memory for Space Applications","authors":"M. Von Thun, P. Nelson, A. Turnbull, B. Baranski","doi":"10.1109/NSREC45046.2021.9679329","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679329","url":null,"abstract":"Single Event Latch-up (SEL) and Total Ionizing Dose (TID) radiation characterization was performed on a CAES quantified-off-the-shelf (QCOTS) 512Gb 3D NAND flash memory. The device was shown to be suitable for space applications.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126626220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679331
E. Cascio, B. Gottschalk
We describe a very low-cost high precision 2D beam scanning system, based on a consumer 3D printer, that is suitable for radiation beam size and uniformity quality assurance measurements.
{"title":"A Low-Cost High Precision 2D Beam Scanning Device Based on a Consumer 3D Printer","authors":"E. Cascio, B. Gottschalk","doi":"10.1109/NSREC45046.2021.9679331","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679331","url":null,"abstract":"We describe a very low-cost high precision 2D beam scanning system, based on a consumer 3D printer, that is suitable for radiation beam size and uniformity quality assurance measurements.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122102475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679348
R. Koga, S. Davis, A. Berman, D. Mabry
We present observations of heavy ion induced single event effects on the XQE-0920 CMOS imager microcircuit. Pixel upsets as well as upsets accompanying a high level of bias current were observed.
{"title":"Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit","authors":"R. Koga, S. Davis, A. Berman, D. Mabry","doi":"10.1109/NSREC45046.2021.9679348","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679348","url":null,"abstract":"We present observations of heavy ion induced single event effects on the XQE-0920 CMOS imager microcircuit. Pixel upsets as well as upsets accompanying a high level of bias current were observed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"19 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126108100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679352
D. Hiemstra, S. Shi, Z. Yang, L. Chen
Results of Cobalt-60 irradiation of a CMOS low dropout voltage regulator at high and low dose rate are, presented. Hardness assurance implications due to observation of ELDRS for analog CMOS microcircuits are, discussed.
{"title":"Total Dose Performance at High and Low Dose Rate of a CMOS, Low Dropout Voltage Regulator showing Enhanced Low Dose Rate Sensitivity","authors":"D. Hiemstra, S. Shi, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679352","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679352","url":null,"abstract":"Results of Cobalt-60 irradiation of a CMOS low dropout voltage regulator at high and low dose rate are, presented. Hardness assurance implications due to observation of ELDRS for analog CMOS microcircuits are, discussed.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116021206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679340
K. Kruckmeyer, T. Trinh, Heriberto Castro, Aaron Black, Vibhu Vanjari, R. Gooty, Samantha Williams, Derek Payne
The LMK04832-SP is a JESD204B compliant clock conditioner with integrated VCOs that can provide clock signals up to 3.2 GHz on up to 14 outputs. The device was tested for ELDRS and SEE and shown to be ELDRS-free, rated to 100 krad(Si) for low dose rate environments and SEL and SEFI immune. ELDRS, RLAT, MAAT, SEL, SEFI and SEU data are presented.
{"title":"Total Ionizing Dose and Single Event Effects Test Results of Texas Instruments LMK04832-SP (5962R1722701 VXC) 3.2 GHz JESD204B Clock Jitter Cleaner with 14 Outputs","authors":"K. Kruckmeyer, T. Trinh, Heriberto Castro, Aaron Black, Vibhu Vanjari, R. Gooty, Samantha Williams, Derek Payne","doi":"10.1109/NSREC45046.2021.9679340","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679340","url":null,"abstract":"The LMK04832-SP is a JESD204B compliant clock conditioner with integrated VCOs that can provide clock signals up to 3.2 GHz on up to 14 outputs. The device was tested for ELDRS and SEE and shown to be ELDRS-free, rated to 100 krad(Si) for low dose rate environments and SEL and SEFI immune. ELDRS, RLAT, MAAT, SEL, SEFI and SEU data are presented.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132173302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679334
S. Shi, D. Hiemstra, Z. Yang, L. Chen
The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).
{"title":"SEE and TID Evaluation of the ADC ADS8350 Using Proton Irradiation","authors":"S. Shi, D. Hiemstra, Z. Yang, L. Chen","doi":"10.1109/NSREC45046.2021.9679334","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679334","url":null,"abstract":"The susceptibility to both SEE and TID of the ADS8350 was tested using 105 MeV protons. No SEE was observed while the device failed at a TID of 25 krad (Si).","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121560958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679341
S. L. Katz, J. Likar, Chi H. Pham, Dakai Chen, Natnael J. Ahmed
The OPA128 is an electrometer grade operational amplifier with femtoamp bias currents [1], potentially offering better performance than other rad-hard precision op amps available today [2], [3], [4], [5], [6]. Heavy ion testing to qualify it for use on the Europa Clipper mission uncovered a destructive failure not noted in prior testing [7], [8], [9], precipitating additional testing to explore the failure and determine the part's viability for spaceflight. Testing yielded a proposed safe operating area (SOA). Non-destructive transient events were also observed and characterized for multiple applications.
{"title":"Heavy Ion Single Event Effects (SEE) results for OPA128 Electrometer Grade Operational Amplifier","authors":"S. L. Katz, J. Likar, Chi H. Pham, Dakai Chen, Natnael J. Ahmed","doi":"10.1109/NSREC45046.2021.9679341","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679341","url":null,"abstract":"The OPA128 is an electrometer grade operational amplifier with femtoamp bias currents [1], potentially offering better performance than other rad-hard precision op amps available today [2], [3], [4], [5], [6]. Heavy ion testing to qualify it for use on the Europa Clipper mission uncovered a destructive failure not noted in prior testing [7], [8], [9], precipitating additional testing to explore the failure and determine the part's viability for spaceflight. Testing yielded a proposed safe operating area (SOA). Non-destructive transient events were also observed and characterized for multiple applications.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128491769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679337
L. Artola, T. Chiarella, T. Nuns, G. Cussac, J. Mitard
This work presents the TID evaluation of iN14 technology developed by IMEC under gamma irradiations. The impacts of TID on electrical characteristics and on the transistor-to-transistor variability are presented for nFinFET for several gate lengths.
{"title":"Total Ionizing Dose Effects ofn-FinFET Transistor in iN14 Technology","authors":"L. Artola, T. Chiarella, T. Nuns, G. Cussac, J. Mitard","doi":"10.1109/NSREC45046.2021.9679337","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679337","url":null,"abstract":"This work presents the TID evaluation of iN14 technology developed by IMEC under gamma irradiations. The impacts of TID on electrical characteristics and on the transistor-to-transistor variability are presented for nFinFET for several gate lengths.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"135 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121366867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679328
B. Vermeire, D. L. Hansen
Total ionizing dose and heavy ion radiation test results are provided or two commercial $mu text{Module}$ regulators that have no comparable space-qualified equivalents. Results suggest that these parts may not be suitable for most missions.
{"title":"Total Ionizing Dose and Heavy Ion Irradiation Test Results of $mu text{Module}$ Regulators","authors":"B. Vermeire, D. L. Hansen","doi":"10.1109/NSREC45046.2021.9679328","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679328","url":null,"abstract":"Total ionizing dose and heavy ion radiation test results are provided or two commercial $mu text{Module}$ regulators that have no comparable space-qualified equivalents. Results suggest that these parts may not be suitable for most missions.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132016969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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