Acomprehensive compact SCR model for CDM ESD circuit simulation

Abstract

We have presented a comprehensive SCR compact model for CDM simulation. The work illustrated the useful and effective macromodeling approach of integrating the various industry standard models to describe the different devices imbedded in the SCR and treating the CDM-relevant operation states. In additional to the prediction of TLP results, the presented model demonstrates the effectiveness in analyzing CDM response of the I/O circuits and successfully explains why the input pins have lower CDM robustness than the output pins.