0.6-μm 12 K-gate ECL gate array with RAM and ROM

T. Nishimura, H. Satoh, M. Tatsuki, A. Ohba, S. Hine, K. Uga, Y. Kuramitsu
{"title":"0.6-μm 12 K-gate ECL gate array with RAM and ROM","authors":"T. Nishimura, H. Satoh, M. Tatsuki, A. Ohba, S. Hine, K. Uga, Y. Kuramitsu","doi":"10.1109/CICC.1989.56763","DOIUrl":null,"url":null,"abstract":"A 12 K-gate ECL (emitter-coupled logic) gate array with dedicated memory has been developed using 0.6-μm bipolar process technology. The memory is available for RAM or ROM storage. The gate array can also be used to implement a configurable RAM having internal cells","PeriodicalId":165054,"journal":{"name":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1989.56763","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

A 12 K-gate ECL (emitter-coupled logic) gate array with dedicated memory has been developed using 0.6-μm bipolar process technology. The memory is available for RAM or ROM storage. The gate array can also be used to implement a configurable RAM having internal cells
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带有RAM和ROM的12 k栅极ECL栅极阵列
采用0.6 μm双极工艺技术,开发了一种12 k栅极专用存储器ECL(发射器耦合逻辑)栅极阵列。内存可用于RAM或ROM存储。门阵列还可用于实现具有内部单元的可配置RAM
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