{"title":"The development and challenges of millimeter wave test system for package level","authors":"Lim Chee Chiang, N. Shairi","doi":"10.1109/APACE.2007.4603960","DOIUrl":null,"url":null,"abstract":"The existing automated test system (ATS) for MMIC package level in Avago Technologies immature for the rigorous requirements of millimeter wave products testing. This has demanded the accountability for test development engineer to develop a new test system platform for MMIC product testing at millimeter wave frequencies. This particular test system comprises of test equipments and test software - test equipments are automatically controlled by the test software. This new developed platform comes with a wholly set of challenges during test development processes especially product correlation and product test time will be deliberately discussed on this paper.","PeriodicalId":356424,"journal":{"name":"2007 Asia-Pacific Conference on Applied Electromagnetics","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Asia-Pacific Conference on Applied Electromagnetics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APACE.2007.4603960","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The existing automated test system (ATS) for MMIC package level in Avago Technologies immature for the rigorous requirements of millimeter wave products testing. This has demanded the accountability for test development engineer to develop a new test system platform for MMIC product testing at millimeter wave frequencies. This particular test system comprises of test equipments and test software - test equipments are automatically controlled by the test software. This new developed platform comes with a wholly set of challenges during test development processes especially product correlation and product test time will be deliberately discussed on this paper.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
