{"title":"/spl alpha/-particle-induced soft errors in submicron SOI SRAM","authors":"Y. Tosaka, K. Suzuki, T. Sugii","doi":"10.1109/VLSIT.1995.520849","DOIUrl":null,"url":null,"abstract":"We found the critical /spl alpha/-particle-induced generated charge which determines the soft errors in SOI SRAMs and showed that the soft error rate in submicron SOI SRAMs without body contacts is sometimes larger than that for bulk SRAMs due to the bipolar effect. This suggests the necessity for body contacts or for other technologies in SOI SRAM structures to reduce the bipolar effect.","PeriodicalId":328379,"journal":{"name":"1995 Symposium on VLSI Technology. Digest of Technical Papers","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1995 Symposium on VLSI Technology. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.1995.520849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
We found the critical /spl alpha/-particle-induced generated charge which determines the soft errors in SOI SRAMs and showed that the soft error rate in submicron SOI SRAMs without body contacts is sometimes larger than that for bulk SRAMs due to the bipolar effect. This suggests the necessity for body contacts or for other technologies in SOI SRAM structures to reduce the bipolar effect.
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