{"title":"A filamentation-free insulated-gate controlled thyristor and comparisons to the IGBT","authors":"K. Lilja, W. Fichtner","doi":"10.1109/ISPSD.1996.509498","DOIUrl":null,"url":null,"abstract":"An insulated-gate controlled thyristor is presented which has a saturating on-state current characteristic and a stable homogeneous current distribution during turn-on and turn-off. The design of the device and a proposed fabrication-process is discussed. The new device has the robust qualities of the IGBT (current saturation, homogeneous current distribution, insulated gate control), and the four-layer thyristor structure allows for a strong reduction in losses compared to the IGBT. A comparison by simulation for high-voltage devices shows that the losses can be reduced by a factor of 2-3 at 3 kV switching and by a factor of 4 at 6 kV switching, as compared to an optimized planar IGBT structure. We also show simulations comparing the stability of these devices against dynamic avalanche-induced current filamentation instabilities.","PeriodicalId":377997,"journal":{"name":"8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings","volume":"397 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1996.509498","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
An insulated-gate controlled thyristor is presented which has a saturating on-state current characteristic and a stable homogeneous current distribution during turn-on and turn-off. The design of the device and a proposed fabrication-process is discussed. The new device has the robust qualities of the IGBT (current saturation, homogeneous current distribution, insulated gate control), and the four-layer thyristor structure allows for a strong reduction in losses compared to the IGBT. A comparison by simulation for high-voltage devices shows that the losses can be reduced by a factor of 2-3 at 3 kV switching and by a factor of 4 at 6 kV switching, as compared to an optimized planar IGBT structure. We also show simulations comparing the stability of these devices against dynamic avalanche-induced current filamentation instabilities.