{"title":"An experimental study of EMI reduction of DC-DC converter with frequency hopping technique","authors":"H. Huynh, S. Joo, Soyoung Kim","doi":"10.1109/EDAPS.2016.7893138","DOIUrl":null,"url":null,"abstract":"In this paper, the EMI problem of the DC-DC converter is discussed. The power spectrums of the DC-DC converter's nodes are analyzed and the noise scanner method is used to prove that the switching node of the DC-DC converter is the dominant source of EMI. To reduce EMI of DC-DC converters, frequency hopping technique can be applied. The DC-DC converter with frequency hopping technique is fabricated using 180nm CMOS process. The test chip results by IC-stripline and noise scanner methods show a significant improvement in EMI. The EMI reduction amount is 6.87 dB at fundamental switching frequency by applying the frequency hopping technique with IC-stripline measurement.","PeriodicalId":191549,"journal":{"name":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","volume":"159 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2016.7893138","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
In this paper, the EMI problem of the DC-DC converter is discussed. The power spectrums of the DC-DC converter's nodes are analyzed and the noise scanner method is used to prove that the switching node of the DC-DC converter is the dominant source of EMI. To reduce EMI of DC-DC converters, frequency hopping technique can be applied. The DC-DC converter with frequency hopping technique is fabricated using 180nm CMOS process. The test chip results by IC-stripline and noise scanner methods show a significant improvement in EMI. The EMI reduction amount is 6.87 dB at fundamental switching frequency by applying the frequency hopping technique with IC-stripline measurement.
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