Simulation of frequency dependent conductor loss in interconnects

D. Divekar, R. Raghuram, F. Balistreri, N. Matsui
{"title":"Simulation of frequency dependent conductor loss in interconnects","authors":"D. Divekar, R. Raghuram, F. Balistreri, N. Matsui","doi":"10.1109/ECTC.1996.550514","DOIUrl":null,"url":null,"abstract":"Simulation of frequency dependence of conductor losses is important for getting accurate electrical performance data of interconnects. The method of characteristics is extended to take into account this effect. The method is well suited for incorporating into a general purpose circuit analysis program for time domain simulation. This enables the analysis of interconnects connected in any arbitrary topology along with the associated nonlinear circuits for high speed digital and analog systems.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.550514","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Simulation of frequency dependence of conductor losses is important for getting accurate electrical performance data of interconnects. The method of characteristics is extended to take into account this effect. The method is well suited for incorporating into a general purpose circuit analysis program for time domain simulation. This enables the analysis of interconnects connected in any arbitrary topology along with the associated nonlinear circuits for high speed digital and analog systems.
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互连中频率相关导体损耗的仿真
模拟导线损耗的频率依赖性对获得准确的互连电性能数据具有重要意义。对特征法进行了扩展,以考虑这种影响。该方法非常适合于集成到通用电路分析程序中进行时域仿真。这使得可以分析连接在任意拓扑中的互连以及高速数字和模拟系统的相关非线性电路。
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