RAVAGE: Post-silicon validation of mixed signal systems using genetic stimulus evolution and model tuning

B. Muldrey, Sabyasachi Deyati, Michael J. Giardino, A. Chatterjee
{"title":"RAVAGE: Post-silicon validation of mixed signal systems using genetic stimulus evolution and model tuning","authors":"B. Muldrey, Sabyasachi Deyati, Michael J. Giardino, A. Chatterjee","doi":"10.1109/VTS.2013.6548917","DOIUrl":null,"url":null,"abstract":"With trends in mixed-signal systems-on-chip indicating increasingly extreme scaling of device dimensions and higher levels of integration, the tasks of both design and device validation is becoming increasingly complex. Post-silicon validation of mixed-signal/RF systems provides assurances of functionality of complex systems that cannot be asserted by even some of the most advanced simulators. We introduce RAVAGE (from “random;” “validation;” and “generation”), an algorithm for generating stimuli for post-silicon validation of mixed-signal systems. The approach of RAVAGE is new in that no assumption is made about any design anomaly present in the DDT; but rather, the stimulus is generated using the DUT itself with the objective of maximizing the effects of any behavioral differences between the DUT (hardware) and its behavioral model (software) as can be seen in the differences of their response to the same stimulus. Stochastic test generation is used since the exact nature of any behavioral anomaly in the DUT cannot be known a priori. Once a difference is observed, the model parameters are tuned using nonlinear optimization algorithms to remove the difference between its and the DUT's responses and the process (test generation→tuning) is repeated. If a residual error remains at the end of this process that is larger than a predetermined threshold, then it is concluded that the DUT contains unknown and possibly malicious behaviors that need further investigation. Experimental results on an RF system (hardware) are presented to prove feasibility of the proposed technique.","PeriodicalId":138435,"journal":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 31st VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2013.6548917","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

With trends in mixed-signal systems-on-chip indicating increasingly extreme scaling of device dimensions and higher levels of integration, the tasks of both design and device validation is becoming increasingly complex. Post-silicon validation of mixed-signal/RF systems provides assurances of functionality of complex systems that cannot be asserted by even some of the most advanced simulators. We introduce RAVAGE (from “random;” “validation;” and “generation”), an algorithm for generating stimuli for post-silicon validation of mixed-signal systems. The approach of RAVAGE is new in that no assumption is made about any design anomaly present in the DDT; but rather, the stimulus is generated using the DUT itself with the objective of maximizing the effects of any behavioral differences between the DUT (hardware) and its behavioral model (software) as can be seen in the differences of their response to the same stimulus. Stochastic test generation is used since the exact nature of any behavioral anomaly in the DUT cannot be known a priori. Once a difference is observed, the model parameters are tuned using nonlinear optimization algorithms to remove the difference between its and the DUT's responses and the process (test generation→tuning) is repeated. If a residual error remains at the end of this process that is larger than a predetermined threshold, then it is concluded that the DUT contains unknown and possibly malicious behaviors that need further investigation. Experimental results on an RF system (hardware) are presented to prove feasibility of the proposed technique.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
蹂躏:后硅验证混合信号系统使用遗传刺激进化和模型调谐
随着混合信号片上系统的发展趋势表明,器件尺寸越来越大,集成水平越来越高,设计和器件验证的任务变得越来越复杂。混合信号/射频系统的后硅验证提供了复杂系统功能的保证,即使是一些最先进的模拟器也无法断言。我们介绍了RAVAGE(来自“随机”、“验证”和“生成”),这是一种为混合信号系统的后硅验证生成刺激的算法。RAVAGE的方法是新的,因为它没有假设滴滴涕中存在任何设计异常;而是使用被试本身产生刺激,其目的是最大化被试(硬件)与其行为模型(软件)之间的任何行为差异的影响,这可以从它们对相同刺激的反应差异中看出。由于DUT中任何行为异常的确切性质不能先验地知道,因此使用随机测试生成。一旦观察到差异,使用非线性优化算法对模型参数进行调整,以消除其与被测设备响应之间的差异,并重复该过程(测试生成→调整)。如果在此过程结束时残留的错误大于预定的阈值,则可以得出结论,该DUT包含未知且可能是恶意的行为,需要进一步调查。在射频系统(硬件)上的实验结果证明了该技术的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Path selection based on static timing analysis considering input necessary assignments Hot topic session 4A: Reliability analysis of complex digital systems SOC test compression scheme using sequential linear decompressors with retained free variables Contactless test access mechanism for TSV based 3D ICs Experiments and analysis to characterize logic state retention limitations in 28nm process node
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1