Bulk silicon micro electro mechanical devices fabricated from commercial BESOI substrates

A. Benitez, J. Esteve, J. Bausells
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引用次数: 13

Abstract

A great number of micro electro mechanical (MEM) devices have been developed during the last decade. The fabrication of such devices is usually based in some kuid of surface micromachining technology, in which supporting sacrificial layers are removed to free the niicromechanical structures. Due to its technological compatibility with standard IC processing, polycrystalline silicon has been used as the device material for MEM devices such as beams [ 11, pin joints, cranks and sliders (21, gears [3], electrostatic micromotors [4] and electrostatic combdriven structures [SI. The standard chemical vapor deposition method for polysilicon limits the thickness of the microstructures to a few microns. However, for many kinds of microstructures a greater thickness is beneficial. These would include devices with its motion constrained to the plane parallel to the substrate. In that case the increased thickness increases the stiffness of the device in the direction perpendicular to the plane of motion. Also, for devices that use electrostatic attraction between sidewalls as the driving force, such as comb actuators aid micromotors, the increased thickness allows a greater driving power for a given voltage.
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由商用BESOI衬底制造的大块硅微电子机械装置
在过去的十年中,大量的微机电器件被开发出来。这种器件的制造通常基于某种表面微加工技术,其中去除支撑牺牲层以释放微观机械结构。由于多晶硅与标准集成电路工艺的技术兼容性,它已被用作MEM器件的器件材料,如梁[11]、销接头、曲柄和滑块(21)、齿轮[3]、静电微电机[4]和静电组合驱动结构[SI]。多晶硅的标准化学气相沉积方法将微结构的厚度限制在几微米。然而,对于许多种类的微结构,较大的厚度是有益的。这些将包括其运动限制在平行于基板的平面上的设备。在这种情况下,增加的厚度在垂直于运动平面的方向上增加了装置的刚度。此外,对于使用侧壁之间的静电吸引力作为驱动力的设备,例如梳状致动器和微电机,在给定电压下,增加的厚度允许更大的驱动功率。
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