Variations in SET pulse shapes in the LM124A and LM111

M. Savage, T. Turflinger, J. Titus, H. F. Barsun, A. Sternberg, Y. Boulghassoul, L. Massengill
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引用次数: 35

Abstract

We present a paper that shows remarkable variation in single-event transient (SET) pulse signal shape for the LM124 operational amplifier, and the LM111 voltage comparator. Both the data and the test methods used are presented.
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LM124A和LM111中SET脉冲形状的变化
本文展示了LM124运算放大器和LM111电压比较器的单事件瞬态(SET)脉冲信号形状的显著变化。给出了试验数据和试验方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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Radiation effects testing facilities in PSI during implementation of the Proscan project Ion beam testing of ALTERA APEX FPGAs Updated responses of devices from the FSG and FSP radiation-hardened power MOSFET families to 1-MeV equivalent neutrons Single event effects and prompt dose hardness of a deep submicron commercial process Variations in SET pulse shapes in the LM124A and LM111
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