Hau-Yung Chen, Ming Juan, Hsin-Hao Chen, Arvin Guan
{"title":"Practical electrical parameter aware methodology for analog designers with emphasis on LDE aware for devices","authors":"Hau-Yung Chen, Ming Juan, Hsin-Hao Chen, Arvin Guan","doi":"10.1109/VLSI-DAT.2014.6834922","DOIUrl":null,"url":null,"abstract":"The device layout structure has proven to have profound effects to its electrical characteristics for advanced technology nodes, which, if not taken into account during the design cycle, will have devastating impact to the circuit functionality. A new design methodology is presented in this paper, which can help circuit designers identify early in the design stage the performance implication due to shift of critical device instance parameters from its layout.","PeriodicalId":267124,"journal":{"name":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2014.6834922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The device layout structure has proven to have profound effects to its electrical characteristics for advanced technology nodes, which, if not taken into account during the design cycle, will have devastating impact to the circuit functionality. A new design methodology is presented in this paper, which can help circuit designers identify early in the design stage the performance implication due to shift of critical device instance parameters from its layout.