Practical electrical parameter aware methodology for analog designers with emphasis on LDE aware for devices

Hau-Yung Chen, Ming Juan, Hsin-Hao Chen, Arvin Guan
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引用次数: 3

Abstract

The device layout structure has proven to have profound effects to its electrical characteristics for advanced technology nodes, which, if not taken into account during the design cycle, will have devastating impact to the circuit functionality. A new design methodology is presented in this paper, which can help circuit designers identify early in the design stage the performance implication due to shift of critical device instance parameters from its layout.
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模拟设计人员实用的电气参数感知方法,重点是器件的LDE感知
对于先进技术节点来说,器件布局结构对其电气特性有着深远的影响,如果在设计周期中不加以考虑,将对电路的功能产生毁灭性的影响。本文提出了一种新的设计方法,可以帮助电路设计人员在设计阶段早期识别由于关键器件实例参数从其布局中转移而导致的性能影响。
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