{"title":"A technique for fast calculations of capacitance matrices of interconnect structures","authors":"V. Veremey, R. Mittra","doi":"10.1109/EPEP.1997.634081","DOIUrl":null,"url":null,"abstract":"A finite difference (FD) method for rapid and accurate evaluation of capacitance matrices of interconnect configurations is described. Novel techniques for the truncation of FD mesh, that significantly reduce the CPU time, are presented.","PeriodicalId":220951,"journal":{"name":"Electrical Performance of Electronic Packaging","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1997.634081","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A finite difference (FD) method for rapid and accurate evaluation of capacitance matrices of interconnect configurations is described. Novel techniques for the truncation of FD mesh, that significantly reduce the CPU time, are presented.