Center Gate Molding challenges and improvements for cavity down TBGA packages

K. Muniandy, S. Hian, Teng Seng Kiong
{"title":"Center Gate Molding challenges and improvements for cavity down TBGA packages","authors":"K. Muniandy, S. Hian, Teng Seng Kiong","doi":"10.1109/EPTC.2012.6507040","DOIUrl":null,"url":null,"abstract":"Center Gate Molding or also known as Pin Gate Molding is a molding method that is gaining a lot of interest in the market in recent times. This is due to its improvement in wire sweep performance for ultra fine pitch wire bonding and ability to capitalize desirable mold compound mechanical properties. The main reason for this is the mold flow of the compound is radial with the wire which will minimize flow stress on bonded wire rather than opposing the wire in the typical side gate molding. This paper discusses the key challenges and the improvements that have been implemented for the center gate molding for the cavity down TBGA (Tape Ball Grid Array) package in the High Volume Manufacturing (HVM). Substrate type which includes the different stack up of the polyimide tape was one of the major concerns for implementing molding on the cavity down TBGA package. The various substrate stack up of the polyimide tape were evaluated and Design of Experiments (DOE) were applied to determine the optimum molding process conditions in order to achieve a material set for overall process robustness.","PeriodicalId":431312,"journal":{"name":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 14th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2012.6507040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Center Gate Molding or also known as Pin Gate Molding is a molding method that is gaining a lot of interest in the market in recent times. This is due to its improvement in wire sweep performance for ultra fine pitch wire bonding and ability to capitalize desirable mold compound mechanical properties. The main reason for this is the mold flow of the compound is radial with the wire which will minimize flow stress on bonded wire rather than opposing the wire in the typical side gate molding. This paper discusses the key challenges and the improvements that have been implemented for the center gate molding for the cavity down TBGA (Tape Ball Grid Array) package in the High Volume Manufacturing (HVM). Substrate type which includes the different stack up of the polyimide tape was one of the major concerns for implementing molding on the cavity down TBGA package. The various substrate stack up of the polyimide tape were evaluated and Design of Experiments (DOE) were applied to determine the optimum molding process conditions in order to achieve a material set for overall process robustness.
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中空TBGA封装的中心浇口成型挑战与改进
中心浇口成型或也称为销浇口成型是一种成型方法,最近在市场上获得了很多兴趣。这是由于它改善了超细间距焊丝的扫丝性能,并能够充分利用理想的模具复合机械性能。这样做的主要原因是该化合物的模具流是径向的,这将最大限度地减少流动应力的粘合线,而不是反对线在典型的侧浇口成型。本文讨论了在大批量生产(HVM)中,TBGA(带球网格阵列)封装腔下的中心浇口成型所面临的主要挑战和已经实施的改进措施。衬底类型包括聚酰亚胺胶带的不同堆叠,这是实现对腔下TBGA封装成型的主要问题之一。对聚酰亚胺胶带的各种衬底堆叠进行了评估,并应用实验设计(DOE)来确定最佳成型工艺条件,以实现整体工艺稳健性的材料集。
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