{"title":"On the minimal test set for single fault location","authors":"Xiao Sun, F. Lombardi, D. Sciuto","doi":"10.1109/EURDAC.1993.410648","DOIUrl":null,"url":null,"abstract":"A new heuristic algorithm (based on the fault dictionary approach) that finds the minimal test set for locating single faults (of the stuck-at type) in a digital circuit, thus reducing the size of the fault dictionary, is presented. The proposed algorithm is based on finding the transitive closure of the vectors in the test set with respect to the functional dominancies using Warshall's algorithm for binary matrices. The space complexity of the proposed algorithm is O(ma.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"116 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1993.410648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A new heuristic algorithm (based on the fault dictionary approach) that finds the minimal test set for locating single faults (of the stuck-at type) in a digital circuit, thus reducing the size of the fault dictionary, is presented. The proposed algorithm is based on finding the transitive closure of the vectors in the test set with respect to the functional dominancies using Warshall's algorithm for binary matrices. The space complexity of the proposed algorithm is O(ma.<>
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