Capabilities of Vectorial Large-Signal Measurements to Validate RF Large-Signal Device Models

Abstract

The trend towards system-on-chip realisation tightens the design specifications and consequently imposes high accuracy requirements on device models. This paper presents an overview of the surplus value of using vectorial large-signal measurements to validate the large-signal accuracy of RF MOSFET models. We show that these models can be evaluated at operating conditions close to real applications, such as intermodulation characterisation combined with loadpull. The large-signal model verification is not limited to analogue applications, because also the RF large-signal performance of digital circuits, such as inverters, can be examined. In this paper, we focus to the results obtained for the BSIM3v3 compact model and for the in-house developed large-signal look-up table model.