A 4.1 pJ/b 25.6 Gb/s 4-PAM reduced-state sliding-block Viterbi detector in 14 nm CMOS

Hazar Yueksel, M. Braendli, A. Burg, G. Cherubini, R. Cideciyan, P. Francese, S. Furrer, M. Kossel, L. Kull, D. Luu, C. Menolfi, T. Morf, T. Toifl
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引用次数: 6

Abstract

The implementation of a digital four-level pulse-amplitude-modulation reduced-state sliding-block Viterbi detector (VD) with two substates and two embedded per-survivor decision-feedback taps operating at one-eighth of the modulation rate is described. Implemented in an experimental chip fabricated in 14nm CMOS, the VD is designed to recover data at 25.6 Gb/s over an emulated time-dispersive channel. The power consumption of the VD together with the test circuitry is 105mW at a supply of 0.7V, achieving an overall energy efficiency of 4.1 pJ/b. At a supply of 0.8V, a data rate of 30.4 Gb/s is achieved with an energy efficiency of 5.3 pJ/b. The VD occupies an area of 0.507×0.717mm2. Experimental results showing system performance are obtained using a (215-1)-bit pseudo-random binary sequence. The impact on the bit error rate of the synchronization length for block initialization is also measured.
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14nm CMOS下4.1 pJ/b 25.6 Gb/s 4-PAM降态滑块Viterbi探测器
描述了一种数字四电平脉冲幅度调制降态滑块Viterbi检测器(VD)的实现,该检测器具有两个子状态和两个嵌入的每个幸存者决策反馈分岔,工作速率为调制速率的八分之一。VD在14nm CMOS实验芯片上实现,在模拟的时间色散信道上以25.6 Gb/s的速度恢复数据。在0.7V的电源下,VD和测试电路的功耗为105mW,实现了4.1 pJ/b的总能量效率。在0.8V的电源下,数据速率达到30.4 Gb/s,能量效率为5.3 pJ/b。VD的面积为0.507×0.717mm2。实验结果表明,采用(215-1)位伪随机二进制序列,系统性能良好。还测量了块初始化时同步长度对误码率的影响。
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