{"title":"Mechanism of Ceramic Capacitor Leakage Failures due to Low DC Stress","authors":"Ken Sato, Y. Ogata, K. Ohno, H. Ikeo","doi":"10.1109/IRPS.1980.362940","DOIUrl":null,"url":null,"abstract":"Ceramic capacitors failed insulation resistance testing at dc voltages far below their rated voltages. Using improved techniques of microanalysis and electrochemical methods, we found that failures resulted from electromigration of electrode materials through a small space in dielectrics filled with a solution containing Cl ions. This mechanism could explain electrical behaviours of failed capacitors.","PeriodicalId":270567,"journal":{"name":"18th International Reliability Physics Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1980.362940","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17
Abstract
Ceramic capacitors failed insulation resistance testing at dc voltages far below their rated voltages. Using improved techniques of microanalysis and electrochemical methods, we found that failures resulted from electromigration of electrode materials through a small space in dielectrics filled with a solution containing Cl ions. This mechanism could explain electrical behaviours of failed capacitors.
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