Computing DC large change sensitivities

D. Divekar, H. Daseking, R. Apte
{"title":"Computing DC large change sensitivities","authors":"D. Divekar, H. Daseking, R. Apte","doi":"10.1109/CICC.1989.56804","DOIUrl":null,"url":null,"abstract":"Large change sensitivities are needed in many situations since parameters are subjected to variations that are not small. The authors have implemented three different methods in SPICE3 for computing DC large change sensitivities. The incremental approach is observed to give speed improvements of more than an order of magnitude over the direct approach","PeriodicalId":165054,"journal":{"name":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1989 Proceedings of the IEEE Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1989.56804","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Large change sensitivities are needed in many situations since parameters are subjected to variations that are not small. The authors have implemented three different methods in SPICE3 for computing DC large change sensitivities. The incremental approach is observed to give speed improvements of more than an order of magnitude over the direct approach
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计算直流大变化灵敏度
由于参数受到不小的变化,因此在许多情况下需要较大的变化灵敏度。作者在SPICE3中实现了三种不同的方法来计算DC大变化灵敏度。观察到,增量方法比直接方法的速度提高了一个数量级以上
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