Crystallographic effects in implantation of oxygen for SIMOX

M. Anc, B.F. Cordts, L. Allen, W. Krull, M. Guerra
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Abstract

In this paper we will discuss aspects of directional or crystallographic effects in implantation of oxygen, with emphasis on the possibility of effects of pinhole formation due to the channeling phenomenon, and application of the intentionally channeled implant to obtain better properties of thin film layers.<>
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SIMOX氧注入中的晶体学效应
在本文中,我们将讨论氧注入中的定向或晶体效应,重点是由于沟槽现象而形成针孔的可能性的影响,以及有意沟槽注入的应用以获得更好的薄膜层性能
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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A feasibility study of SiC on oxide by wafer bonding and layer transferring A 1-M bit SRAM on SIMOX material Characterization of SIMOX material with channeled and unchanneled oxygen implantation Radiation effects in BESOI structures with different insulating layers A bulk-JFET and CMOS/SIMOX technology for low noise, high speed charge-sensitive amplifier
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