Continuing challenge of improving measurement accuracy in terahertz vector network analyzers (INVITED) — The Taming of "Terahertz vector network analyzers"

Abstract

Metrological traceability is required for testing and spurious emission management. Even if above 110 GHz frequency, metrological traceability is universally important, however the system set-up and calibration method are as important as the metrology standards due to high cost and low stability / reproducibility for the measurement system and standards as compared to those in the microwave frequency range. In recent years, operation frequency of commercial vector network analyzers (VNA) reaches currently up to 1.6 THz. Key priorities for improvement of VNA measurement accuracy are waveguide interface performance, operation conditions, hardware set-up, calibration standards and methods. Then, measurement traceability and uncertainty, further verification process, including measurement comparison, are absolutely necessary for quality of measurements. The presentation introduces all key priority together with latest research achievements, then gives recommendation for accurate VNA measurement in Terahertz.