Pub Date : 2015-12-03DOI: 10.1109/ARFTG.2015.7381459
X. Ma, X. Du, C. Multari, Y. Ning, C. Palego, X. Luo, V. Gholizadeh, X. Cheng, J. Hwang
Using a coplanar waveguide with a series gap in conjunction with dielectrophoresis trapping, consecutive S-parameter measurements between 0.5 and 20 GHz were quickly performed with and without a Jurkat cell trapped to compensate for a relatively noisy and drifting background. This allowed the small cytoplasm capacitance, on the order of 10 fF, to be reliably extracted. The extracted cytoplasm capacitance is within a factor of 2 of the previously reported value by using a shunt trap but is believed to be more accurate. The present technique can complement previously developed microwave and RF techniques in characterizing the capacitances and resistances of plasma and membrane for complete characterization of the electrical properties of a simple cell.
{"title":"Broadband single-cell detection with a coplanar series gap","authors":"X. Ma, X. Du, C. Multari, Y. Ning, C. Palego, X. Luo, V. Gholizadeh, X. Cheng, J. Hwang","doi":"10.1109/ARFTG.2015.7381459","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381459","url":null,"abstract":"Using a coplanar waveguide with a series gap in conjunction with dielectrophoresis trapping, consecutive S-parameter measurements between 0.5 and 20 GHz were quickly performed with and without a Jurkat cell trapped to compensate for a relatively noisy and drifting background. This allowed the small cytoplasm capacitance, on the order of 10 fF, to be reliably extracted. The extracted cytoplasm capacitance is within a factor of 2 of the previously reported value by using a shunt trap but is believed to be more accurate. The present technique can complement previously developed microwave and RF techniques in characterizing the capacitances and resistances of plasma and membrane for complete characterization of the electrical properties of a simple cell.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129386265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381460
Perry Li, Lequan Zhang, Franklin Liu, Jorge N. Amely-Velez
RF communication with implantable medical devices (IMD) such as a pacemaker experience unique challenges due to the operating conditions within a human body. This includes added body losses caused by the different tissue compositions where material properties range from εr=58 (muscle) to εr=5.58 (fat). In order to achieve maximum throughput for a 402MHz RF signal, it is important to have minimum mismatch losses between the RF front end of a device and the embedded antenna. This paper presents a method to optimize the matching with various tissues using load pull analysis with a prototype implantable medical device as an example. By using automated impedance tuners, an optimum impedance point was found, improving the mismatch loss by as much as 3dB compared to a design with no consideration given to tissue variation.
{"title":"Optimized matching of an implantable medical device antenna in different tissue medium using load pull measurements","authors":"Perry Li, Lequan Zhang, Franklin Liu, Jorge N. Amely-Velez","doi":"10.1109/ARFTG.2015.7381460","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381460","url":null,"abstract":"RF communication with implantable medical devices (IMD) such as a pacemaker experience unique challenges due to the operating conditions within a human body. This includes added body losses caused by the different tissue compositions where material properties range from εr=58 (muscle) to εr=5.58 (fat). In order to achieve maximum throughput for a 402MHz RF signal, it is important to have minimum mismatch losses between the RF front end of a device and the embedded antenna. This paper presents a method to optimize the matching with various tissues using load pull analysis with a prototype implantable medical device as an example. By using automated impedance tuners, an optimum impedance point was found, improving the mismatch loss by as much as 3dB compared to a design with no consideration given to tissue variation.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126101692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381472
M. Pulido-Gaytán, J. Reynoso‐Hernández, M. C. Maya‐Sanchez, J. R. Loo-Yau
In this paper, the impact of knowing the impedance of the lines used in the TRL calibration (Z) on the load-pull (LP) characterization of power transistors is assessed. Relevant parameters, such as input impedance (Zin), load impedance (Zld) and large-signal gain are considered. By using the ABCD-parameters matrix formalism in the calibration of the LP measurement setup, closed form expressions for evaluating the impact of knowing Z on the calculation of these parameters are presented. It is demonstrated that knowing Z is of paramount importance in the calculation of Zin and Zld. Regarding the gain, it is demonstrated that while the voltage and current gains do not depend on the knowledge of Z, the gain expressed as the ratio of the transmitted to incident waves does.
{"title":"The impact of knowing the impedance of the lines used in the TRL calibration on the load-pull characterization of power transistors","authors":"M. Pulido-Gaytán, J. Reynoso‐Hernández, M. C. Maya‐Sanchez, J. R. Loo-Yau","doi":"10.1109/ARFTG.2015.7381472","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381472","url":null,"abstract":"In this paper, the impact of knowing the impedance of the lines used in the TRL calibration (Z) on the load-pull (LP) characterization of power transistors is assessed. Relevant parameters, such as input impedance (Zin), load impedance (Zld) and large-signal gain are considered. By using the ABCD-parameters matrix formalism in the calibration of the LP measurement setup, closed form expressions for evaluating the impact of knowing Z on the calculation of these parameters are presented. It is demonstrated that knowing Z is of paramount importance in the calculation of Zin and Zld. Regarding the gain, it is demonstrated that while the voltage and current gains do not depend on the knowledge of Z, the gain expressed as the ratio of the transmitted to incident waves does.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122651901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381473
M. Spirito, L. Galatro, G. Lorito, T. Zoumpoulidis, F. Mubarak
In this contribution we analyze the accuracy improvements of Reciprocal SOL planar calibrations when employing full-wave EM simulation to extract the standard's models. The calibration accuracy is benchmarked with the conventional (polynomial fit) standard definitions as well as with calibration techniques employing standards with partially-unknown parameters, as the LRM. Moreover, an outlook at a technology based on integrated circuit fabrication, employing fused silica substrates is described in terms of the achievable spread of its conductive and resistive layers. Such technology, in combination with the proposed EM modelling of the standards would allow to reduce the residual errors of planar calibrations.
{"title":"Improved RSOL planar calibration via EM modelling and reduced spread resistive layers","authors":"M. Spirito, L. Galatro, G. Lorito, T. Zoumpoulidis, F. Mubarak","doi":"10.1109/ARFTG.2015.7381473","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381473","url":null,"abstract":"In this contribution we analyze the accuracy improvements of Reciprocal SOL planar calibrations when employing full-wave EM simulation to extract the standard's models. The calibration accuracy is benchmarked with the conventional (polynomial fit) standard definitions as well as with calibration techniques employing standards with partially-unknown parameters, as the LRM. Moreover, an outlook at a technology based on integrated circuit fabrication, employing fused silica substrates is described in terms of the achievable spread of its conductive and resistive layers. Such technology, in combination with the proposed EM modelling of the standards would allow to reduce the residual errors of planar calibrations.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130377829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381462
Jeong-Hwan Kim, Jin-Seob Kang, J. Park, T. Kang
This paper presents a new method for the determination of the complex permittivity of thin sheet dielectric materials that are flexible and elastic. Instead of the traditional method to install a doughnut shape sample in the transverse plane used in transmission line methods, most widely used methods for broadband permittivity measurements, a thin sheet sample is installed onto the outer conductor of the coaxial transmission line. The proposed method has much large sensitivity compared to the traditional one and is a broadband technique useful for thin sheet materials. Measurement results and comparison with other approaches agree very well, particularly at high frequency range.
{"title":"Measurement methods for the permittivity of thin sheet dielectric materials","authors":"Jeong-Hwan Kim, Jin-Seob Kang, J. Park, T. Kang","doi":"10.1109/ARFTG.2015.7381462","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381462","url":null,"abstract":"This paper presents a new method for the determination of the complex permittivity of thin sheet dielectric materials that are flexible and elastic. Instead of the traditional method to install a doughnut shape sample in the transverse plane used in transmission line methods, most widely used methods for broadband permittivity measurements, a thin sheet sample is installed onto the outer conductor of the coaxial transmission line. The proposed method has much large sensitivity compared to the traditional one and is a broadband technique useful for thin sheet materials. Measurement results and comparison with other approaches agree very well, particularly at high frequency range.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121756214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381477
A. Savin, V. G. Guba, O. N. Bykova
In the paper results of algorithms' comparison which are utilized for determination of vector network analyzer (VNA) residual parameters are described. Separation of parameters in time domain is the basis for the algorithms. The algorithms based on unscented Kalman filter, least mean square technique and conventional time domain filtering are reviewed. Experimental results are achieved in coplanar waveguide environment in frequency range up to 70 GHz using two precision lines with different lengths.
{"title":"Comparison analysis of VNA residual errors estimation algorithms with time domain separation","authors":"A. Savin, V. G. Guba, O. N. Bykova","doi":"10.1109/ARFTG.2015.7381477","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381477","url":null,"abstract":"In the paper results of algorithms' comparison which are utilized for determination of vector network analyzer (VNA) residual parameters are described. Separation of parameters in time domain is the basis for the algorithms. The algorithms based on unscented Kalman filter, least mean square technique and conventional time domain filtering are reviewed. Experimental results are achieved in coplanar waveguide environment in frequency range up to 70 GHz using two precision lines with different lengths.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132912632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381465
D. Bespalko, S. Boumaiza
A Poly-Harmonic Distortion (PHD) model extraction procedure is proposed to improve the model accuracy for unmatched, broadband RF transistors by minimizing multi-harmonic signal reflections within the measurement system. As a result, the fictitious need for higher-order models is avoided by minimizing the order of the nonlinear measurement system used to extract the model. Under strongly nonlinear conditions the accuracy of the PHD model is improved by 5dB, in terms of Normalized Mean-Squared Error (NMSE), averaging less than 1% time-domain output power error.
{"title":"Enhanced PHD model extraction by improving harmonic response superposition during extraction","authors":"D. Bespalko, S. Boumaiza","doi":"10.1109/ARFTG.2015.7381465","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381465","url":null,"abstract":"A Poly-Harmonic Distortion (PHD) model extraction procedure is proposed to improve the model accuracy for unmatched, broadband RF transistors by minimizing multi-harmonic signal reflections within the measurement system. As a result, the fictitious need for higher-order models is avoided by minimizing the order of the nonlinear measurement system used to extract the model. Under strongly nonlinear conditions the accuracy of the PHD model is improved by 5dB, in terms of Normalized Mean-Squared Error (NMSE), averaging less than 1% time-domain output power error.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129487679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381470
K. Dražil, A. Pavlis, M. Hudlička
In this article vector network analyzer (VNA) calibration schemes suitable for traceable scattering parameter measurements in rectangular waveguides at millimeter-wave and submillimeter-wave frequencies are compared with well-established techniques being used at lower frequencies. Comparison measurements were performed in the frequency band 33 GHz-50 GHz.
{"title":"Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies, using the 33 GHz–50 GHz band","authors":"K. Dražil, A. Pavlis, M. Hudlička","doi":"10.1109/ARFTG.2015.7381470","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381470","url":null,"abstract":"In this article vector network analyzer (VNA) calibration schemes suitable for traceable scattering parameter measurements in rectangular waveguides at millimeter-wave and submillimeter-wave frequencies are compared with well-established techniques being used at lower frequencies. Comparison measurements were performed in the frequency band 33 GHz-50 GHz.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129006808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381474
M. Haase, K. Hoffmann
The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).
{"title":"Calibration/verification standards for measurement of extremely high impedances","authors":"M. Haase, K. Hoffmann","doi":"10.1109/ARFTG.2015.7381474","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381474","url":null,"abstract":"The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122409409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-12-01DOI: 10.1109/ARFTG.2015.7381471
A. Visweswaran, C. De Martino, Emilio Sirignano, M. Spirito
In this contribution we present a custom test-bench capable of delivering multi-path mm-wave signals with amplitude and phase control to an on-wafer environment. The setup employs direct IQ up-conversion in the 7.5GHz to 10GHz band, with high resolution DACs to modulate both amplitude and phases of n coherent LO signals. Signal amplification followed by frequency multiplication generates mm-wave signals in the 30 to 40GHz range. An amplitude pre-distortion technique, to level the IQ mixer output power versus phase angle, and a calibration technique are developed to achieve accurate amplitude and phase control between the signals at the wafer probe-tip level.
{"title":"An IQ-steering technique for amplitude and phase control of mm-wave signals","authors":"A. Visweswaran, C. De Martino, Emilio Sirignano, M. Spirito","doi":"10.1109/ARFTG.2015.7381471","DOIUrl":"https://doi.org/10.1109/ARFTG.2015.7381471","url":null,"abstract":"In this contribution we present a custom test-bench capable of delivering multi-path mm-wave signals with amplitude and phase control to an on-wafer environment. The setup employs direct IQ up-conversion in the 7.5GHz to 10GHz band, with high resolution DACs to modulate both amplitude and phases of n coherent LO signals. Signal amplification followed by frequency multiplication generates mm-wave signals in the 30 to 40GHz range. An amplitude pre-distortion technique, to level the IQ mixer output power versus phase angle, and a calibration technique are developed to achieve accurate amplitude and phase control between the signals at the wafer probe-tip level.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129761769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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