{"title":"Calibration/verification standards for measurement of extremely high impedances","authors":"M. Haase, K. Hoffmann","doi":"10.1109/ARFTG.2015.7381474","DOIUrl":null,"url":null,"abstract":"The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 86th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2015.7381474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The paper concerns the design of calibration/verification standards suitable for a system developed to be capable of measuring extreme impedances. Values of standard impedances cover the range from 5 kΩ to approx. 200 kΩ. The paper focuses on selecting a structure compatible with an APC-7 connector and its optimization taking into account also the presence of higher order modes and technology demands. CST Microwave Studio (CST) is used for simulations. S-parameters of the final structure are verified by means of an independent 3D simulator ANSYS HFSS (HFSS).
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