Failure probability of SRAM-FPGA systems with Stochastic Activity Networks

Abstract

We describe a simulation-based fault injection technique for calculating the probability of failures caused by SEUs in the configuration memory of SRAM-FPGA systems. Our approach relies on a model of FPGA netlists realised with the Stochastic Activity Networks (SAN) formalism. We validate our method by reproducing the results presented in other studies for some representative combinatorial circuits, and we explore the applicability of the proposed technique by analysing the actual implementation of a circuit for the generation of Cyclic Redundancy Check codes.