O. Ginez, J. Daga, P. Girard, C. Landrault, Serge, Pravossoudovitch, A. Virazel
{"title":"Embedded flash testing: overview and perspectives","authors":"O. Ginez, J. Daga, P. Girard, C. Landrault, Serge, Pravossoudovitch, A. Virazel","doi":"10.1109/DTIS.2006.1708721","DOIUrl":null,"url":null,"abstract":"The evolution of system-on-chip (SoC) designs involves the development of non-volatile memory technologies like flash. Embedded flash (eFlash) memories are based on the floating-gate transistor concept and can be subject to complex hard defects creating functional faults. In this paper, we present a complete analysis of a particular failure mechanism, referred as disturb phenomenon. Moreover, we analyze the efficiency of a particular test sequence to detect this disturb phenomenon. Finally we conclude on the interest to develop new test infrastructure well adapted to the eFlash environment","PeriodicalId":399250,"journal":{"name":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2006.1708721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The evolution of system-on-chip (SoC) designs involves the development of non-volatile memory technologies like flash. Embedded flash (eFlash) memories are based on the floating-gate transistor concept and can be subject to complex hard defects creating functional faults. In this paper, we present a complete analysis of a particular failure mechanism, referred as disturb phenomenon. Moreover, we analyze the efficiency of a particular test sequence to detect this disturb phenomenon. Finally we conclude on the interest to develop new test infrastructure well adapted to the eFlash environment
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