{"title":"Design and testing of facilities ground","authors":"D.R. Stockin","doi":"10.1109/EOSESD.2000.890104","DOIUrl":null,"url":null,"abstract":"The goal of this manuscript is to provide the base knowledge needed to be able to properly manage the testing and/or improvement of a facilities grounding system. Solutions for static charge problems rely on dedicated earth grounds with a resistance-to-ground typically specified at less than 5 ohms. Simple driven rods cannot normally reach this goal and often do not meet the NEC standard of 25 ohms resistance-to-ground. Proper testing and design will provide quantitative data to the EOS/ESD engineer and reduce the potential for revenue loss caused by ESD faults.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2000.890104","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The goal of this manuscript is to provide the base knowledge needed to be able to properly manage the testing and/or improvement of a facilities grounding system. Solutions for static charge problems rely on dedicated earth grounds with a resistance-to-ground typically specified at less than 5 ohms. Simple driven rods cannot normally reach this goal and often do not meet the NEC standard of 25 ohms resistance-to-ground. Proper testing and design will provide quantitative data to the EOS/ESD engineer and reduce the potential for revenue loss caused by ESD faults.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
场地设施的设计和测试
本文的目的是提供必要的基础知识,以便能够正确地管理设施接地系统的测试和/或改进。静电问题的解决方案依赖于专用接地,其对地电阻通常指定小于5欧姆。简单的驱动杆通常无法达到这一目标,并且通常不符合NEC标准的25欧姆对地电阻。适当的测试和设计将为EOS/ESD工程师提供定量数据,并减少ESD故障造成的潜在收益损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
ESD damage thresholds: history and prognosis [magnetic heads] Electrostatic discharge characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors A study of static-dissipative tweezers for handling giant magneto-resistive recording heads A study of the mechanisms for ESD damage to reticles Floating gate EEPROM as EOS indicators during wafer-level GMR processing
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1