{"title":"Your future in the technology evolution of the 90's","authors":"G. Madland","doi":"10.1109/VMIC.1989.78070","DOIUrl":null,"url":null,"abstract":"The purpose of this discussion is to provide some insight into matters that will affect the technologist's career in the coming decade. The author examines some of these factors from the viewpoint of the integrated circuit technologist. The role of production is assessed along with utilization of active devices on top of the silicon integrated circuit. The author argues that for the technologist, the new devices will introduce requirements for additional materials knowledge, additional processing knowledge, greater complexity of test equipment, and additional failure modes.<<ETX>>","PeriodicalId":302853,"journal":{"name":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VMIC.1989.78070","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The purpose of this discussion is to provide some insight into matters that will affect the technologist's career in the coming decade. The author examines some of these factors from the viewpoint of the integrated circuit technologist. The role of production is assessed along with utilization of active devices on top of the silicon integrated circuit. The author argues that for the technologist, the new devices will introduce requirements for additional materials knowledge, additional processing knowledge, greater complexity of test equipment, and additional failure modes.<>
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