{"title":"Efficiency comparison of signature monitoring schemes for FSMs","authors":"R. Rochet, R. Leveugle, G. Saucier","doi":"10.1109/ASPDAC.1995.486391","DOIUrl":null,"url":null,"abstract":"This paper addresses the detection of permanent and transient faults in complex VLSI circuits, with a particular focus on faults leading to sequencing errors. Several Finite State Machine implementations using signature monitoring for control-flow checking are compared in terms of error detection latency, theoretical error coverage, experimental error coverage and area overheads. Advantages and drawbacks of each approach are presented.","PeriodicalId":119232,"journal":{"name":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","volume":"106 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1995.486391","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
This paper addresses the detection of permanent and transient faults in complex VLSI circuits, with a particular focus on faults leading to sequencing errors. Several Finite State Machine implementations using signature monitoring for control-flow checking are compared in terms of error detection latency, theoretical error coverage, experimental error coverage and area overheads. Advantages and drawbacks of each approach are presented.
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