R. Muralidhar, R. Steimle, M. Sadd, R. Rao, C. Swift, E. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, Ko-Min Chang, B. White
{"title":"A 6 V embedded 90 nm silicon nanocrystal nonvolatile memory","authors":"R. Muralidhar, R. Steimle, M. Sadd, R. Rao, C. Swift, E. Prinz, J. Yater, L. Grieve, K. Harber, B. Hradsky, S. Straub, B. Acred, W. Paulson, W. Chen, L. Parker, S. Anderson, M. Rossow, T. Merchant, M. Paransky, T. Huynh, D. Hadad, Ko-Min Chang, B. White","doi":"10.1109/IEDM.2003.1269353","DOIUrl":null,"url":null,"abstract":"The first functional 6 V, 4 Mb silicon nanocrystal based nonvolatile memory arrays using conventional 90 nm and 0.25 /spl mu/m process technologies have been produced. The technology can be programmed and erased using conventional techniques in floating gate memories and can substantially reduce the cost of embedded flash at the 90 nm node and beyond.","PeriodicalId":344286,"journal":{"name":"IEEE International Electron Devices Meeting 2003","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"64","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Electron Devices Meeting 2003","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2003.1269353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 64
Abstract
The first functional 6 V, 4 Mb silicon nanocrystal based nonvolatile memory arrays using conventional 90 nm and 0.25 /spl mu/m process technologies have been produced. The technology can be programmed and erased using conventional techniques in floating gate memories and can substantially reduce the cost of embedded flash at the 90 nm node and beyond.